SN74BCT8373ADW Datasheet PDF - TI

●description

●The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

●Members of the Texas Instruments SCOPEFamily of Testability Products

●Octal Test-Integrated Circuits

●Functionally Equivalent to ’F373 and ’BCT373 in the Normal-Function Mode

●Compatible With the IEEE Standard  1149.1-1990 (JTAG) Test Access Port and  Boundary-Scan Architecture

●Test Operation Synchronous to Test Access Port (TAP)

●Implement Optional Test Reset Signal by  Recognizing a Double-High-Level Voltage  (10 V) on TMS Pin

●SCOPEInstruction Set

●  – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

●  – Parallel Signature Analysis at Inputs

●  – Pseudo-Random Pattern Generation From Outputs

●  – Sample Inputs/Toggle Outputs

●Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)