SN74BCT8245ADWRE4 Datasheet PDF - TI

●description

●The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitryis accomplished via the 4-wire test access port (TAP) interface.

●Members of the Texas Instruments SCOPE™Family of Testability Products

●Octal Test-Integrated Circuits

●Functionally Equivalent to ’F245 and ’BCT245 in the Normal- Function Mode

●Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture

●Test Operation Synchronous to Test Access Port (TAP)

●Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin

●SCOPE™Instruction Set

●− IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

●− Parallel-Signature Analysis at Inputs

●− Pseudo-Random Pattern Generation From Outputs

●− Sample Inputs/Toggle Outputs

●Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)